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With the WaferChipCounter you can calculate your production with a button click.
In many fields wafers are still manually inspected for good and defect chips. This check is time-consuming and affords comparison with the effectually produced number of dies after finishing in order to be able to count the production. The WaferChipCounter was developed to render the clip production from a variety of wafers . At fist you can calculate the number of dies on the wafer in general.This it is also important if you use a breakage wafer. The wafer mark checker automatically calculates the available chip number and subtracts the defect dies.
Combined with a macro stand and a high-resolution camera the wafer is scanned. The systems offers the option to analyze any wafer – the whole wafer and parts of it.
For an optimum processing the exposure time can be controlled via interface of the wafer mark checker. The camera has features to optimize the images.
The wafer data can be saved and restored with the project management. A log file saves the main process which can be analyzed.
Because new wafers eventually need new parameters it is possible to add not yet captured ink-points and delete the wronly inked ones. Thus even in exceptional cases you can react quickly and without stopping the working precedure.
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