| Software for thin film spectroscopic reflectrometry measurement NanoCalc-2000 |  | Reliable and easy measurement of transparent and semi transparent thin layers. With a C-mount adapter it is possible to adapt the standard fiber sonde to nearly every microscope (i.e. Leitz/Leica, Zeiss, Reichert, Olympus, Nikon).
Price on demand ProMicron 24 Bachmühlweg 74366 Kirchheim /Neckar
Telephone: +49 7143 - 40560
Fax: +49 7143 - 405615
Email: info@promicron.com
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Depending on the layer and substrate material the system can measure layers of just a few nanometers up to several hundreds of microns.
The large spectral range available from 250nm (UV) to 1100nm (NIR), as well as our special simulation algorithms allow the measurement not only of standard samples like oxides, nitrides and resists on ideal substrates like silicon wafer or glass but also the measurement of critical layers like DLC (diamond like carbon) on metal, layers on unpolished steel plates or the thickness of transparent foils. The NanoCalc thin film measurement system is based upon optical white light interference. This white light interference pattern is translated through mathematical functions into optical thickness calculation. |
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