overview 

 

QuadraQueck 5000 3D-measuring software for microscopes and 3D-measuring machines

QuadraQueck 5000 3D-measuring software for microscopes and 3D-measuring machinesincl. measuring axis board. Software with comprehensive 2D and 3D measurements, if desired also for automatic microscopes, rates according configuration
 
Art.No.:QC-5k

Price on demand
ProMicron
24 Bachmühlweg
74366 Kirchheim /Neckar

Telephone: +49 7143 - 40560
Fax: +49 7143 - 405615
Email: info@promicron.com

3D measuring software (incl. measuring axis board) for microscopes and 3D measuring machines,
enables comprehensive 2D and 3D measuring options, ie. constructions:
 
  • multiple coordinate system
  • multi-sensor-system  (for camera, laser, roentgen) 
  • 4 axis - CNC-contious path control for servo and step relay 
  • image processing with autofocus, position recognition (even for several units), measure point filter for particles of dirt
  • special function for faint edges, image documentation
  • illumination adjustment, motor driven zoom, programmable INPUT/OUTPUT lines, Stepper motor control for additional motor axis
  • tolerance tests
  • comprehensive data report for own formula, data bank, tolerance tests.
  • Microsoft Office communication
  • operating system WIN NT
  • interface for all types of scales
  • segmental compensation / non-linear compensation of the measuring systems
  • remote control
  • segmental compensation of the measuring systems and electronic angle correction

No other system provides this scope of functions for such a reasonable rate. The following functions are QC 5000 standard.

  • mm/inch conversion
  • programming of pieces
  • graphical piece display (3 D)
  • display shape/statistics
  • save elements without limits
  • construct and define elements
  • coordinate system gimballed/polar
  • CAD interface (export to *dxf)
  • data export (DDE)
  • tolerance test in groups
  • up to 9 coordinate systems

IMPORTANT:

QuadraCheck 5000 also serves as basic software for automatic microscopes,

which  were customised designed and realised. 

The control of  objective turret, ilumination, apertures, xy stages, focus drive, digital camera, measurement sensors (i.e. Laser sensor) in combination with the above-noted measurement functions enable optimum solutions for complex tasks in the field of optical measurement.

Application excamples:

  • automatic measuring microscope for measurments of structure-width of silicon-wafers (CD measuring/critical dimension measuring)
  • automatic and semi-automatic measuring-system for z-measurements of  micro-mechanical sensors (position in leadframe, torsion, tilting).

 

 

 

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