With immediate effect ProMicron is cooperating with Sensofar-Tech (Barcelona, Spain), a multi-national spin-off company from the Polytechnic University of Catalonia (UPC) in the field of optical interferometry/confocal profiling. ProMicron is going to integrate the Sensofar-Tech systems for 3D topographical measurement and 3D profilometry for projects with highly accurate measurement of surfaces and micro structures in customer solutions.
ProMicron is outstanding in engineered solutions. With its own resources for mechanical/optical construction, a powerful mechanical production and a small electronic development team, it is possible to realize customized projects which are far beyond standard solutions. For Sensofar just these main features are essential in order to broaden its market position for optical metrology in Germany. Sensofar-Tech is the only company which as yet has realized a 3D profiler with a combination and integration of three microscopical measuring procedures in one system. Besides the incident bright field standard procedure which is used for the live image display of the high resolution 3D image for topographical analysis there are alternatively several modi: confocal microscopy, white light interference and phaseshift interference available. Therefore an optimum application-related kind of measuring data is rendered. Yet, the measuring head is extraordnarily compact and robust.
According to the measuring mode between 5nm and 0,05mm z-resolutions up to the sub nanometer region were achieved.
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