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Critical Dimension (CD)-, Thin Film Measurement

Wafer/masks - linwidth measurement, critical dimension (CD) measurement, thin film measurement,
spectral reflectometer (white light reflectometry), thin film metrology
5 Products in Critical Dimension (CD)-, Thin Film Measurement 
       
Automatic Thin Film Measuring - Measuring System with Microscope, Optional Wafer Handling
Automatic Thin Film Measuring - Measuring System with Microscope, Optional Wafer Handling
Our partner Mikropack's optical fibre miniature spectrometer Nanocalc(measuring...
INM 200: Measurement, Microscopic Inspection and Measurement on Foil
INM 200: Measurement, Microscopic Inspection and Measurement on Foil
laser autofocus and scanning stages. size of substrates up to 8" (modification...
Art.No.:MCS-TFM
Condition:-
Art.No.:MCS-CD OWI TFM
Condition:-
Price on request
Price on request
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Modernized Leitz Ergoplan e.g. for CD Measurement and Thin Film Measurement
Modernized Leitz Ergoplan e.g. for CD Measurement and Thin Film Measurement
fitted for surface analysis with suitable configuration and additional software...
Art.No.:Ergopl_Struktur
Condition:-
Price on request
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New
       
CD Measuring Device based on INM200/INM200UV
CD Measuring Device based on INM200/INM200UV
Universal fully automated measuring microscope: Measuring of linewidth on...
Thinfilm Measurement Spectral Reflectometry NanoCalc-2000
Thinfilm Measurement Spectral Reflectometry NanoCalc-2000
A C-Mount adapter enables the standard fibre optics to be mounted to almost...
Art.No.:S500500
Condition:New
Art.No.:NanoCalc-MS
Condition:New
Price on request
Price on request
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