overview 

Automated/ Software Supported

Computer-assisted or software-assisted microscopes
full systems for inspection, measuring and handling of wafer and substrate
 


9 Products in Automated/ Software Supported 
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CD Measuring Device based on INM200/INM200UV
Universal fully automated measuring microscope: Measuring of linewidth on...
Fully Automated System for Defect Detection on Blank Wafers
for classification, evaluation and development
Art.No.:S500500
Art.No.:Waferdefect
Price on request
Price on request
Details
Details
  
 
       
INM 200UV Automated Measurement Microscope/Inspection microscope with Laser Autofocus
Fully automated measuring and inspection software for wafer industry. Controllable...
INM100 Microscope with Waferloader NWL200
INM100 microscope with Nikon NWL200 waferloader
Art.No.:INM200UV
Art.No.:INM100_wafer
Price on request
Price on request
Details
Details
  
 
       
INM100 multispectral set up with color, infrared and UV camera
measuring and inspection microscope with optional confocal module (prices...
Inspec IS Wafer Inspections Software
automated inspection connected to Leica DM microscope. Integration and control...
Art.No.:INM100UV-C
Art.No.:77600100
Price on request
Price on request
Details
Details
  
 
       
Microscope Control Software for Optical Wafer Inspection
defined, software-supported, microscope inspection of wafers and frames...
Promicron MCS Microscope Control Software
Microscope control software, a system platform for optical inspection and...
Art.No.:MCS-OWI
Art.No.:MCS
Price on request
Price on request
Details
Details
  
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